Trötschler T, Al-Hajjawi S, Raghavendran S, Haunschild J, Demant M, Rein S. Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers. SiliconPV Conf Proc [Internet]. 2025 Feb. 3 [cited 2025 Feb. 22];2. Available from: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1265