LANGE, Stefan; HARTWIG, Carl Eric; ER-RAJI, Oussama; SCHULZE, Patricia S. C.; TUREK, Marko; BORCHERT, Juliane. Characterization of Ultrathin Layers in Perovskite/TOPCon Tandem Cells With Photoelectron Spectroscopy Utilizing Advanced Data Evaluation Methods. SiliconPV Conference Proceedings, [S. l.], v. 2, 2024. DOI: 10.52825/siliconpv.v2i.1325. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1325. Acesso em: 19 dec. 2024.