KUMAR, Saravana; DIESTEL, Christian; AL-HAJJAWI, Saed; SCHMITZ, Jurriaan; HEMSENDORF, Marc; HAUNSCHILD, Jonas; RUPITSCH, Stefan J.; REIN, Stefan. Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging. SiliconPV Conference Proceedings, [S. l.], v. 2, 2025. DOI: 10.52825/siliconpv.v2i.1324. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1324. Acesso em: 21 jan. 2025.