WRIGHT, Matthew; SHARPE, Matthew; MCALEESE, Callum; WANG, Yan; SHI, Yifu; BONILLA, Ruy S. Characterisation of SiOX / SiNX Surface Passivation Using Time-of-Flight Elastic Recoil Detection Analysis. SiliconPV Conference Proceedings, [S. l.], v. 2, 2024. DOI: 10.52825/siliconpv.v2i.1315. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1315. Acesso em: 19 dec. 2024.