TRÖTSCHLER, Theresa; AL-HAJJAWI, Saed; RAGHAVENDRAN, Siddharth; HAUNSCHILD, Jonas; DEMANT, Matthias; REIN, Stefan. Deep-Learning Based Depth-Tracking of Stacking-Faults in Epitaxially Grown Silicon Wafers. SiliconPV Conference Proceedings, [S. l.], v. 2, 2025. DOI: 10.52825/siliconpv.v2i.1265. Disponível em: https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1265. Acesso em: 22 feb. 2025.