Geml, F., Mehler, M., Herguth, A., Hahn, G., & Sanz Alonso, S. (2024). Investigation on the Long-Term Stability of AlOx/SiNy:H and SiNy:H Passivation Layers During Illuminated Annealing at Elevated Temperatures. SiliconPV Conference Proceedings, 1. https://doi.org/10.52825/siliconpv.v1i.938