(1)
Geml, F.; Mehler, M.; Herguth, A.; Hahn, G.; Sanz Alonso, S. Investigation on the Long-Term Stability of AlOx SiNy:H and SiNy:H Passivation Layers During Illuminated Annealing at Elevated Temperatures. SiliconPV Conf Proc 2024, 1.